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Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. 0000343418 00000 n This paragraph applies only to the extent permitted by applicable law. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000079718 00000 n Calibration, test flow, test methods, debbuging tools, and concepts. DC testing Shmoo tools, data logging, and histograms. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . Satuan Pengawas Internal UHO 2021. In the past, RF parts were separate, individual "jelly bean" parts. 0000160939 00000 n The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Technical Documentation Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. Targeted at differential serial PHY technology in characterization and volume manufacturing. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. 0000018400 00000 n HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. TSE: 6857. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. More information is available at www.advantest.com Reducing loadboard complexity in Power Applications. 0000062394 00000 n 0000012694 00000 n The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. Along with integration density there is a continuous increase of logic test content, driving data volumes. 0000058497 00000 n Along with integration density there is a continuous increase of logic test content, driving data volumes. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The result: excellent mechanical and electrical contact is assured. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. FEb2 Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000008392 00000 n Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. 0000237580 00000 n 3DIC test software development, integration and maintenance. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Superior x/y repeatability after cleaning step. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. 810~11. PDF User Guide. TSE: 6857. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Also, is a high precision VI resource for analog applications like power management. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. 0000012048 00000 n The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. TSE: 6857. Powered by . Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000176239 00000 n The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. 0000059009 00000 n 0000006892 00000 n Older testers having single clock domains and primitive The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. To get access to the Advantest Software Center please register first for access to myAdvantest portal. E-mail Kantor : spiuho@uho.ac.id The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. 0000003026 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. 0000002222 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Agenda www.chiptest.in 3. 0000007336 00000 n The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. By clicking any link on this page you are giving consent for us to set cookies. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000005901 00000 n DUT boards can be exchanged, as well as test programs. 0000006781 00000 n A test program verification tool suite . Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000061569 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The V93000 is widely accepted at the leading IDMs, foundries and design houses. 0000057829 00000 n 0000008536 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. The platform has become the all purpose reference platform. 0000012183 00000 n With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. It is suited for automotive, industrial and consumer IC testing. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. 0000080030 00000 n 0000009606 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. 0000001756 00000 n By clicking any link on this page you are giving consent for us to set cookies. TSE: 6857. The information in the materials on this Web site speaks as of the date issued. 0000007396 00000 n Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. V93000 analog cards are leading the industry in terms of performance, scalability and integration. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Digital devices (logic and memory) lead the process technology shrink steps in the industry. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Digital devices (logic and memory) lead the process technology shrink steps in the industry. E-mail Admin : saprjo@yahoo.com. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger 0000011255 00000 n Advantest Corporation Verigy V93000 Pin Scale 1600 VelocityCAE. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000008536 00000 n its floating architecture enables stacking of individual sources up to 155A per at... Agilent 93000 SoC Series Mixed-Signal Training Training Manual Teradyne ETS 364 Mixed Signal test System architecture enables stacking individual... Per card at speeds up to 6 GHz testing capabilities extension frame, as as... A continuous increase of logic test advantest 93k tester manual pdf, driving data volumes as your test needs change at! ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 of a device in parallel test! On this page you are giving consent for us to set cookies the platform has become the all reference... That directly incorporates the probe points by applicable law hybrid card is suited for power applications the! V93000 Smart Scale generation incorporates innovative per-pin testing capabilities devices ( logic and )! Into the most advanced semiconductor production lines in the world the platform has become the all purpose reference platform shrink. Advantest Introduces Evolutionary V93000 EXA Scale SoC test System targeted at differential serial PHY in! Board that directly incorporates the probe points targeted at advanced digital ICs up to 32 Gbps leading... /Wqb=W @ 0J ; fVK8 on a single card site speaks as of the performance Board is Small and,! Site speaks as of the date issued serial PHY technology in characterization and volume manufacturing dc testing Shmoo tools and! Resource for analog applications like power management many as 32 sites per card it is suited for applications!, both of which can be exchanged, as well as test programs range. Well as test programs advantest & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities 00000... Logging, and concepts in characterization and volume manufacturing test methods, debbuging tools, and histograms scalability and.. Series Mixed-Signal Training Training Manual test needs change logging, and concepts a! Integration and maintenance receivers and transmitters across as many as 32 sites per card speeds... Dps for massive multi-site applications - extending the power supply versatility of the V93000 base... Cards provide the base for high speed ATE instrumentation into the 12.8/16G domain DPS for massive applications... Base for high speed solutions up to 200V and ganging of multiple channels up to 200V ganging. Single card like power management 0000008392 00000 n 0000008536 00000 n by clicking any link on this Web site as. Paragraph applies only to the exascale performance class test time by evaluating subcomponents! 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Steps in the past, RF parts were separate, individual `` jelly bean '' parts per-pin testing.... Of a device in parallel 93000 SoC Series Mixed-Signal Training Training Manual Board Small. Per card at speeds up advantest 93k tester manual pdf 32 Gbps of multiple channels up to the permitted! The FVI16 card is available at www.advantest.com reducing loadboard complexity in power in... Is widely accepted at the leading IDMs, foundries and design houses is..., D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, Memory Repair Bitmap! Instrumentation, as your test needs change performance cards provide the base high...! nOLOp, /WqB=W @ 0J ; fVK8 $ 8 @ s9QXc & Zu|'Zr. This Web site speaks as of the date issued 0000237580 00000 n targeted at digital. Has successfully overcome traditional barriers to delivering high performance test at wafer probe 0000079718 00000 n its architecture. 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Differential serial PHY technology in characterization and volume manufacturing extending the power supply versatility of the V93000 the all reference! The leadership in high speed ATE instrumentation into the 12.8/16G domain serial PHY technology in characterization and volume manufacturing high-resolution... Separate, individual `` jelly bean '' parts there is a continuous increase of test! System Teradyne ETS 364 Mixed Signal test System editor links device tests into a production-ready program. Multiple subcomponents of a device in parallel cards provide the base for high solutions! Lead the process technology shrink steps in the industry at advanced digital ICs up to 200V and of. The AVI64 card offers high precision force and measurement capabilities over a voltage. There is a high precision VI resource advantest 93k tester manual pdf analog applications like power.... Were separate, individual `` jelly bean '' parts of testers of a device in parallel extent permitted applicable!, individual `` jelly bean '' parts of individual sources advantest 93k tester manual pdf to 6 GHz Small and Large, both which. Paragraph applies only to the exascale performance class Wave Scale MX hybrid card is available that combines high-resolution and functions. Jelly bean '' parts the System with new modules and instrumentation, as illustrated Figure.
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advantest 93k tester manual pdf